Error! No text of specified style in document. - System Integration Manual
CDMA-2X-11004-P1
Objective Specification
Design-In
Page 72 of 79
75
Reference
76
Description
77
Remarks
87
Rint
88
10 k
Ω
Resistor 0402 5% 0.1 W
89
Internal pull-up resistor
Table 21: Example of components as ESD immunity test precautions for the HW_SHUTDOWN line
SIM interface
Sensitive interface is the SIM interface (VSIM pin, SIM_RST pin, SIM_IO pin, SIM_CLK pin):
A 47 pF bypass capacitor (e.g. Murata GRM1555C1H470J) have to be mounted on the lines
connected to VSIM, SIM_RST, SIM_IO and SIM_CLK to assure SIM interface functionality when an
electrostatic discharge is applied to the application board enclosure
It is suggested to use as short as possible connection lines at SIM pins
89.1.1
Antenna interface precautions
The antenna interface ANT can have a critical influence on the ESD immunity test depending on
the application board handling. Antenna precaution suggestions are provided:
If the device implements an embedded antenna and the device insulating enclosure avoids air
discharge up to +8 kV / -8 kV to the antenna interface, no further precautions to ESD immunity
test should be needed
If the device implements an external antenna and the antenna and its connecting cable are
provided with a completely insulating enclosure to avoid air discharge up to +8 kV / -8 kV to the
whole antenna and cable surfaces, no further precautions to ESD immunity test should be
needed
If the device implements an external antenna and the antenna or its connecting cable are not
provided with completely insulating enclosure to avoid air discharge up to +8 kV / -8 kV to the
whole antenna and cable surfaces, the following precautions to ESD immunity test should be
implemented on the application board
A higher protection level is required at the ANT port if the line is externally accessible on the
application board. ESD immunity test requires protection up to +4 kV / -4 kV for direct Contact
Discharge and up to +8 kV / -8 kV for Air Discharge applied to the antenna port.
89.1.2
Module interfaces precautions
All the module pins that are externally accessible should be included in the ESD immunity test since
they are considered to be a port as defined in [13]. Depending on applicability, and in order to
satisfy ESD immunity test requirements and ESD category level, pins connected to the port should
be protected up to +4 kV / -4 kV for direct Contact Discharge, and up to +8 kV / -8 kV for Air
Discharge applied to the enclosure surface.
The maximum ESD sensitivity rating of all the pins of the module, except the ANT pin, is 1 kV (Human
Body Model according to JESD22-A114F). A higher protection level can be achieved by mounting
an ESD protection (e.g. EPCOS CA05P4S14THSG varistor array or CT0402S14AHSG).
For the USB interface a very low capacitance (i.e. less or equal to 1 pF) ESD protection (e.g. Tyco
Electronics PESD0402-140 ESD protection device) can be mounted on the lines connected to
USB_D+ and USB_D- pins.
For the SIM interface a low capacitance (i.e. less than 10 pF) ESD protection (e.g. Infineon
ESD8V0L2B-03L or AVX USB0002) must be placed near the SIM card holder on each line (VSIM,
SIM_IO, SIM_CLK, SIM_RST).
Comment [rjc6]:
I need to check these
contact numbers
