Toshiba Satellite L830, Руководство по обслуживанию

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Test Program for Field.
Satellite L830 Tests and Diagnostics Manual
15
with the original data patterns. Addresses are displayed in 64KB increments
during the test.
Test Process:
1. Byte Enable Test
One bit write/ 8 bit read” is executed and the new data is compared
with the original data.
Test data = CCAA5533H, 80000000H
2. Byte Enable Test
“One bit write/16 bit read” is executed and the new data is compared
with the original data.
Test data = CCAA5533H, 80000000H
3. Data bus test
“One bit write/16 bit read” is executed and the new data is compared
with the original data.
Test data = 1H, 2H, 4H, 8H, 10H, through 80000000H.
4. Fixed data test
“16 bit write/ 16 bit read” is executed and the new data is compared to
the original data.
Test data = FFFFFFFFH, 00000000H, 80018001H
5. Address pattern test
“16 bit write and 16 bit read” of address pattern data is executed and
the new data is compared with the original data.
Test data = 0000H, 0004H, 0008H, 000CH,...8000H, 8004H, through
FFECH
Subtest 04 RAM Refresh
This subtest writes a data pattern (CCAA5533H ) in 4KB from 0 to the
maximum installed memory, then waits for a memory refresh cycle (16 ms or
more), reads the new data, and compares the result with the original data
pattern.