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Model 4200A-SCS Source-Measure Unit (SMU) User's Manual
Section 5: Source-measure concepts
4200A-SMU-900-01 Rev. A December 2020
5-21
Figure 94: Sweep waveforms
A source-delay-measure cycle is performed on each step (or point) of the sweep. One measurement
is made at each step. The time spent at each step depends on how the source-delay-measure cycle
is configured, such as the sweep delay setting.
Typical applications for staircase sweeps include I-V curves for two-terminal and three-terminal
semiconductor devices, characterization of leakage versus voltage, and semiconductor breakdown.