Stanford Research Systems DS335, Руководство пользователя

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Performance Tests 4-5
DS335 Synthesized Function Generator
PERFORMANCE TESTS
INTRODUCTION The procedures in this section test the performance of the DS335. The first
set tests the basic functionality of the DS335 from the front panel. The
second set of tests actually measures the DS335's specifications. The
results of each test may be recorded on the test sheet at the end of this
section.
NECESSARY EQUIPMENT The following equipment is necessary to complete the tests. The suggested
equipment or its equivalent may be used.
Instrument Critical Specifications Recommended Model
Analog Oscilloscope 350 MHz Bandwidth Tektronix 2465
Time Interval Counter Frequency Range: 20 MHz minimum SRS SR620
Time Interval Accuracy: 1ns minimum
FFT Spectrum Analyzer Frequency Range: DC to 100 kHz SRS SR760
Amplitude Accuracy: ±0.2 dB
Distortion: < 75 dB below reference
RF Spectrum Analyzer Frequency Range: 1 kHz to 100 MHz Anritsu MS2601/ HP4195A
Amplitude: ±0.5 dB
Distortion and Spurious: < -70 dB
DC/AC Voltmeter 5 1/2 Digit DC accuracy Fluke 8840A
True RMS AC to 100 kHz
Thermal Converter Input Impedance: 50
Ω
Ballantine 1395A-3
Input Voltage: 3 Vrms
Frequency: DC to 10 MHz
Accuracy: ±0.05dB
10 MHz Frequency Standard Frequency: 10 MHz ± .001 ppm SRS FS700
Phase Noise: < -130 dBc @ 100Hz
50
Ω
Terminator 50
Ω
± 0.2 %, 1 Watt HP 11048C
Doubly Balanced Mixer Impedance: 50
Ω
Mini-Circuits ZAD-3SH
Frequency: 1 - 20 MHz