8. Drive Diagnostics
SONY AIT-1 Turbo drive SDX-470V series Ver. 1.0
8-1
8. Drive Diagnostics
This clause deals with the diagnostics supported by the SDX-470V. Each diagnostic is described in detail and
possible error codes are discussed.
8.1. Overview
The diagnostic firmware for this product is designed to achieve the following objectives:
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Isolate hardware failures
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Verify the media
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Provide predictive information which can lead to the early detection of potential problems
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Provide remote support capabilities
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Satisfy manufacturing testing needs
How these objectives are achieved:
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Fault isolation is achieved by providing an extensive set of diagnostic tests.
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Media verification is achieved by error rate testing and tape logs.
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Predictive data is provided in the form of a tape log and runtime error logs. Logs are maintained within the
drive's RAM, EEPROM and on the AIT cassettes.
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Remote support capability is provided by allowing all tests and test sequences to be initiated via the host
interface. Similarly, all test results are reported back to the host via the interface.
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Manufacturing needs are satisfied by providing unrestricted access to all internal tests.
8.2. Diagnostic
Test
This clause describes the Diagnostic Test facilities of the drive. The method for executing tests and receiving test
results from the Host is described and a full list of available tests and possible result messages is given.
Diagnostics can be initiated in several ways:
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Power-on Self Test
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Send Diagnostic command initiating a Self Test
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Send Diagnostic command initiating a specific test or sequence
Each type of Diagnostics will be described in detail.
8.2.1.
Power-on Self Test
Each time power is applied to the drive it will automatically perform a series of diagnostics on itself to insure that
the basic functions of the drive are performing properly. The power-on Self Test sequence is shown below:
Power supply voltage exceeds power-up threshold
61
Main Processor ROM checksum
62
Main Processor Destructive RAM Test
70
SDX-470V Controller Register Test
Содержание AIT-SDX470
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