Sony AIT-SDX470, Руководство по техническим характеристикам продукции

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8. Drive Diagnostics
SONY AIT-1 Turbo drive SDX-470V series Ver. 1.0 8-4
8.2.4. Diagnostic Test Number Summary
The following is a list of the diagnostic capabilities of the SDX-470V. The Test Availability Code indicates if a
particular test can be executed by the Host computer or is executed during Power-on diagnostics (or both). The
drive also supports three types of diagnostics:
1. Individual Tests - Self contained modules designed to test a particular function of drive
2. Sequences - Automatic execution of a series of individual tests
3. Exercisers - Verification of a major function of the drive such as Read, Write, Search, etc.
The Diagnostic Test Number for each Test, Sequence or Exerciser is shown in the first column.
Test Availability Codes
P – Power-onSelf-test
H – Host Diagnostics
PH – both
Sequence Test
00 Reset Sequence (61, 63, 71, 72, 77-79, 80 81, 30) H
02 Error Rate Test H
Mechanism Controller Kernel Test
20 Mechanism Controller Microprocessor Test P
Drive Exerciser
43 Read Data Exerciser H
Main Processor Kernel Test
61 Main Processor ROM checksum P
62 Main Processor Destructive RAM Test P
63 Main Processor Non-destructive RAM Teset
Drive Test
30 Front Panel Check PH
70 SDX-470V Controller Register Test
71 Buffer RAM Test PH
72 Data Compression Controller Register Test
77 ATA/ATAPI Protocol Controller Function Test
78 ATA/ATAPI Protocol Loop-back Test
79 Data Compression Functions and DMA Line Test PH
80 Internal Message Bus Test PH
81 SDX-470V Controller SRAM Test PH
82 BOT/EOT Sensor Test P