SanDisk CompactFlash 5000 Скачать руководство пользователя страница 11 | Manualshive

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360 Herndon Parkway

Suite

1400

Herndon, VA 20170

http://www.rheintech.com

SanDisk Corporation

Page 11 of 17

DoC Report
2006137
04/27/07

4.3 CONDUCTED

TEST

PHOTOGRAPHS

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Содержание CompactFlash 5000

Страница 1: ...rporation 7 Atir Yeda Street Kfar Saba Israel Phone 972 9 7644908 Device Under Test SanDisk SSD SATA 5000 2 5 Document Number 2007160 Reference Number QRTL07 033 This report may not be reproduced exce...

Страница 2: ...g FCC Class B Compliance Standard s to which device was tested STANDARDS SPECIFIC TESTS APPLICABILITY Tested Not Tested CFR47 Parts 15 109 and 15 107 Radiated and Conducted Emissions Test Engineer Jon...

Страница 3: ...IGURATION OF TESTED SYSTEM 7 3 PRODUCT LABELLING INFORMATION TO THE USER 8 3 1 DOC LABEL ON DEVICE 8 3 2 DOC STATEMENT IN USER S MANUAL 8 3 3 LOCATION OF LABEL ON EUT 8 4 CONDUCTED EMISSIONS 9 4 1 SIT...

Страница 4: ...te 1400 Herndon Va 20170 Complete description and site attenuation measurement data has been placed on file with the Federal Communications Commission The power line conducted emission measurements we...

Страница 5: ...sis o Operating shock 1 500G 0 5msec half sine o Operating vibration 2 17G 7 500 Hz o Operating temperature 0 C to 70 C o Non operating temperature and storage 55 C to 95 C o Operating temperature 0 C...

Страница 6: ...on RTL Bar Code Equipment Arrival Date Laptop PC Dell Latitude D620 PP18L N A DoC Unshielded Power N A 4 10 2007 Laptop AC Adapter Dell LA65NS0 00 CN 0DF263 71615682 2ED4 N A Unshielded 017737 4 10 20...

Страница 7: ...1400 Herndon VA 20170 http www rheintech com SanDisk Corporation Page 7 of 17 DoC Report 2006137 04 27 07 2 5 CONFIGURATION OF TESTED SYSTEM Laptop PC with SanDisk SSD SATA 5000 USB Termination Monito...

Страница 8: ...pursuant to part 15 of the FCC Rules These limits are designed to provide reasonable protection against harmful interference in a residential installation This equipment generates uses and can radiate...

Страница 9: ...ne and electrically connected to the peripheral LISN powers the EUT host peripherals The spectrum analyzer was connected to the A C line through an isolation transformer The 50 ohm output of the EUT L...

Страница 10: ...9 56 0 19 1 46 0 9 1 Pass 15 070 Pk 25 2 2 3 27 5 60 0 32 5 50 0 22 5 Pass 17 640 Pk 28 2 2 5 30 7 60 0 29 3 50 0 19 3 Pass 25 100 Pk 29 4 2 7 32 1 60 0 27 9 50 0 17 9 Pass Phase Conductor Temperatur...

Страница 11: ...360 Herndon Parkway Suite 1400 Herndon VA 20170 http www rheintech com SanDisk Corporation Page 11 of 17 DoC Report 2006137 04 27 07 4 3 CONDUCTED TEST PHOTOGRAPHS...

Страница 12: ...ency the EUT was rotated 360 and the antenna was raised and lowered from 1 to 4 meters in order to determine the emission s maximum level Measurements were taken using both horizontal and vertical ant...

Страница 13: ...orrection Factor SCF used in the above equation is determined empirically and is expressed in the following equation SCF dB m PG dB AF dB m CL dB SCF Site Correction Factor PG Pre amplifier Gain AF An...

Страница 14: ...1 0 42 2 19 4 22 8 30 0 7 2 Pass 200 000 Qp V 190 1 0 35 3 19 0 16 3 30 0 13 7 Pass 225 000 Qp V 290 1 0 32 7 18 5 14 2 30 0 15 8 Pass 250 000 Qp H 160 4 0 44 2 15 5 28 7 37 0 8 3 Pass 369 340 Qp H 19...

Страница 15: ...360 Herndon Parkway Suite 1400 Herndon VA 20170 http www rheintech com SanDisk Corporation Page 15 of 17 DoC Report 2006137 04 27 07 5 4 RADIATED TEST PHOTOGRAPHS...

Страница 16: ...Solar 8130 947306 900729 N A 16A LISN AFJ International LS16 110VAC 16010020080 901083 4 4 2008 16A LISN AFJ International LS16 110VAC 16010020081 901082 1 6 2008 Current Probe Telecom conducted Fisc...

Страница 17: ...g the measurement procedure and test equipment that was used contained in the test report iv A description of the equipment under test EUT and support equipment connected to or installed within the EU...

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