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360 Herndon Parkway 

 Suite 

1400 

 

Herndon, VA 20170 

 http://www.rheintech.com 

 

SanDisk Corporation 

 

 

 

 

 

 

 

 

           Page 5 of 17 

DoC Report 
2006137 
04/27/07 

2 TEST 

DETAILS 

2.1 PRODUCT 

DESCRIPTION 

SanDisk SATA 5000 2.5” SSD is a drop-in replacement for the hard disk drive.  It has no moving/ mechanical 
parts. 
 

Features 
 

o 2.5" small form factor supporting unformatted capacity of 32GB  
o 9.5mm case height  
o SATA 7+15 pins combo connector  

Interface to host  

o Standards: SATA 1.0a 1.5Gb/s  

High performance  

o Host transfer rate: 150MB/s  
o Internal transfer read rate: 67MB/s  
o Internal transfer write rate: 47MB/s  
o Random Read (4KB): 5350 IOPS  
o Average access time: 0.11msec  

Low power consumption  

o Supply voltage: 5Vdc  
o Typical read/write: 190mA  
o Typical idle: 125mA  
o Typical standby: 70mA  
o Typical sleep: 60mA  

Reliability 

o Mean time between failure (MTBF): 2,000,000 hours, based on Part Stress Analysis  
o Operating shock: 1,500G, 0.5msec half sine  
o Operating vibration: 2.17G, 7-500 Hz  
o Operating temperature: 0˚C to 70˚C  
o Non operating temperature and storage: -55˚C to 95˚C  
o Operating temperature: 0˚C to 70˚C  
 

2.2 MODIFICATIONS 

None 
 

2.3  EUT EXERCISE DESCRIPTION 

 
The SanDisk SSD SATA 5000 2.5” was installed in a Class B laptop personal computer which was running 
Windows XP.  The computer was programmed to transfer files continuously, to and from the device under test 
using a software application provided by Dell.  The SanDisk SSD SATA 5000 2.5” was tested as a 
representative of the full line of available capacities.  The only difference among the different sizes is the on-
board flash memory.  Otherwise, there are no physical, clock, or electronic changes.  Determination of the 2.5 
as the “worst case” test sample was determined by SanDisk based on preliminary scanning of the devices under 
test and engineering judgement that:  because of the small changes between the various capacities, any 
changes in emission amplitudes or EMC susceptibility would be inconsequential. 

 

Содержание CompactFlash 5000

Страница 1: ...rporation 7 Atir Yeda Street Kfar Saba Israel Phone 972 9 7644908 Device Under Test SanDisk SSD SATA 5000 2 5 Document Number 2007160 Reference Number QRTL07 033 This report may not be reproduced exce...

Страница 2: ...g FCC Class B Compliance Standard s to which device was tested STANDARDS SPECIFIC TESTS APPLICABILITY Tested Not Tested CFR47 Parts 15 109 and 15 107 Radiated and Conducted Emissions Test Engineer Jon...

Страница 3: ...IGURATION OF TESTED SYSTEM 7 3 PRODUCT LABELLING INFORMATION TO THE USER 8 3 1 DOC LABEL ON DEVICE 8 3 2 DOC STATEMENT IN USER S MANUAL 8 3 3 LOCATION OF LABEL ON EUT 8 4 CONDUCTED EMISSIONS 9 4 1 SIT...

Страница 4: ...te 1400 Herndon Va 20170 Complete description and site attenuation measurement data has been placed on file with the Federal Communications Commission The power line conducted emission measurements we...

Страница 5: ...sis o Operating shock 1 500G 0 5msec half sine o Operating vibration 2 17G 7 500 Hz o Operating temperature 0 C to 70 C o Non operating temperature and storage 55 C to 95 C o Operating temperature 0 C...

Страница 6: ...on RTL Bar Code Equipment Arrival Date Laptop PC Dell Latitude D620 PP18L N A DoC Unshielded Power N A 4 10 2007 Laptop AC Adapter Dell LA65NS0 00 CN 0DF263 71615682 2ED4 N A Unshielded 017737 4 10 20...

Страница 7: ...1400 Herndon VA 20170 http www rheintech com SanDisk Corporation Page 7 of 17 DoC Report 2006137 04 27 07 2 5 CONFIGURATION OF TESTED SYSTEM Laptop PC with SanDisk SSD SATA 5000 USB Termination Monito...

Страница 8: ...pursuant to part 15 of the FCC Rules These limits are designed to provide reasonable protection against harmful interference in a residential installation This equipment generates uses and can radiate...

Страница 9: ...ne and electrically connected to the peripheral LISN powers the EUT host peripherals The spectrum analyzer was connected to the A C line through an isolation transformer The 50 ohm output of the EUT L...

Страница 10: ...9 56 0 19 1 46 0 9 1 Pass 15 070 Pk 25 2 2 3 27 5 60 0 32 5 50 0 22 5 Pass 17 640 Pk 28 2 2 5 30 7 60 0 29 3 50 0 19 3 Pass 25 100 Pk 29 4 2 7 32 1 60 0 27 9 50 0 17 9 Pass Phase Conductor Temperatur...

Страница 11: ...360 Herndon Parkway Suite 1400 Herndon VA 20170 http www rheintech com SanDisk Corporation Page 11 of 17 DoC Report 2006137 04 27 07 4 3 CONDUCTED TEST PHOTOGRAPHS...

Страница 12: ...ency the EUT was rotated 360 and the antenna was raised and lowered from 1 to 4 meters in order to determine the emission s maximum level Measurements were taken using both horizontal and vertical ant...

Страница 13: ...orrection Factor SCF used in the above equation is determined empirically and is expressed in the following equation SCF dB m PG dB AF dB m CL dB SCF Site Correction Factor PG Pre amplifier Gain AF An...

Страница 14: ...1 0 42 2 19 4 22 8 30 0 7 2 Pass 200 000 Qp V 190 1 0 35 3 19 0 16 3 30 0 13 7 Pass 225 000 Qp V 290 1 0 32 7 18 5 14 2 30 0 15 8 Pass 250 000 Qp H 160 4 0 44 2 15 5 28 7 37 0 8 3 Pass 369 340 Qp H 19...

Страница 15: ...360 Herndon Parkway Suite 1400 Herndon VA 20170 http www rheintech com SanDisk Corporation Page 15 of 17 DoC Report 2006137 04 27 07 5 4 RADIATED TEST PHOTOGRAPHS...

Страница 16: ...Solar 8130 947306 900729 N A 16A LISN AFJ International LS16 110VAC 16010020080 901083 4 4 2008 16A LISN AFJ International LS16 110VAC 16010020081 901082 1 6 2008 Current Probe Telecom conducted Fisc...

Страница 17: ...g the measurement procedure and test equipment that was used contained in the test report iv A description of the equipment under test EUT and support equipment connected to or installed within the EU...

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