3 PRODUCT DESCRIPTION
© 2022 RAYLASE GmbH SUPERSCAN IV
MN105-en / v1.0.12
24
3.7.7
Aperture-specific parameters – SUPERSCAN IV-20
3.7.7.1
Mechanical specifications
Mirror substrate
QU - Fused silica
SI - Silicon
SC - Silicon carbide
Input aperture [mm]
20
Beam displacement [mm]
26.0
Weight without objective [kg]
approx. 5.5
Dimension (L x W x H) [mm]
203 × 159 × 150/ 160.5
1
1) AXIALSCAN variation, additional output plate for protective window.
3.7.7.2
Dynamic behaviour
Mirror substrate
QU - Fused silica
SI - Silicon
SC - Silicon carbide
Tuning
1
VC
VC
W
Processing speed at 30 V [rad/s]
45
45
50
-
Processing speed at 48 V [rad/s]
50
60
75
200
Positioning speed at 30 V [rad/s]
2
45
45
50
-
Positioning speed at 48 V [rad/s]
2
50
60
75
200
Tracking error [ms]
3
0.28
3
0.25
4
0.20
3
0.40
5
Step response time at 1 % of full scale [ms]
6
0.70
0.62
0.50
1.20
Position noise (RMS) [µrad]
< 4.5
1) VC - Optimized tuning for a wide range of applications with emphasis on processing speed.
2) Calculation of the speed in the working field: Focal length F-Theta lens × speed.
Example: Deflection unit with F-Theta lens f = 254 mm, speed 30 rad/s
=> 254/1000 × 30 = 7.6 m/s.
3) Calculation of acceleration time approx. 1.9 × tracking error.
4) Calculation of acceleration time approx. 2.0 × tracking error.
5) Calculation of acceleration time approx. 3.0 × tracking error.
6) Controlled to 1/5,000 of full scale.
