3 PRODUCT DESCRIPTION
© 2022 RAYLASE GmbH SUPERSCAN IV
MN105-en / v1.0.12
22
3.7.5
Aperture-specific parameters – SUPERSCAN IV-10
3.7.5.1
Mechanical specifications
Mirror substrate
SI - Silicon
Input aperture [mm]
10
Beam displacement [mm]
12.5
Weight without objective [kg]
approx. 3.2
Dimension (L x W x H) [mm]
170 × 125 × 117.5
3.7.5.2
Dynamic behaviour
Mirror substrate
SI - Silicon
Tuning
1
M
VC
Processing speed at 30 V [rad/s]
30
50
Processing speed at 48 V [rad/s]
30
80
Positioning speed at 30 V [rad/s]
2
30
50
Positioning speed at 48 V [rad/s]
2
30
80
Tracking error [ms]
0.10
3
0.12
4
Step response time at 1 % of full scale [ms]
5
0.41
0.33
Position noise (RMS) [µrad]
< 4.5
1) M - Optimized tuning for high precision beam deflection with sharp corners and minimized tracking error.
VC - Optimized tuning for a wide range of applications with emphasis on processing speed.
2) Calculation of the speed in the working field: Focal length F-Theta lens × speed.
Example: Deflection unit with F-Theta lens f = 254 mm, speed 30 rad/s
=> 254/1000 × 30 = 7.6 m/s.
3) Calculation of acceleration time approx. 1.8 × tracking error.
4) Calculation of acceleration time approx. 1.9 × tracking error.
5) Controlled to 1/5,000 of full scale.
