Qlogic FastLinQ 3400 Series, Руководство пользователя, Страница: 272 / 287

17–User Diagnostics in DOS
Diagnostic Test Descriptions
244 83840-546-00 E
Group B: Memory Tests
B1 TXP Scratchpad The Group B tests verify all memory blocks of the
QLogic 8400/3400 Series adapters by writing various
data patterns (0x55aa55aa, 0xaa55aa55, walking
zeroed, walking ones, address, and so on.) to each
memory location, reading back the data, and then com-
paring it to the value written. The fixed data patterns are
used to ensure that no memory bit is stuck high or low,
while the walking zeroed/ones and address tests are
used to ensure that memory writes do not corrupt adja-
cent memory locations.
B2 TPAT Scratch-
pad
B3 RXP Scratchpad
B4 COM Scratch-
pad
B5 CP Scratchpad
B6 MCP Scratch-
pad
B7 TAS Header Buf-
fer
B8 TAS Payload
Buffer
B9 RBUF via GRC
B10 RBUF via Indi-
rect Access
B11 RBUF Cluster
List
B12 TSCH List
B13 CSCH List
B14 RV2P Scratch-
pads
B15 TBDC Memory
B16 RBDC Memory
B17 CTX Page Table
B18 CTX Memory
Table 17-2. Diagnostic Tests (Continued)
Test
Description
Number Name