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formats, and conversion between different image formats. The optional image
processing software enhanced a series of image processing functions such as
particle size analysis, on the basis of standard image processing software.
1.2.
Main uses and scope of application
Scanning electron microscope is suitable tool for observation of surface
topography of metal, ceramic, semiconductor, mineral, biological, polymer,
composite materials and nanoscale one-dimensional, two-dimensional and three-
dimensional materials (secondary electron image, backscattered electron image);
Analysis of point, line and surface components of the micro-area. It is widely used
in petroleum, geology, minerals, electronics, semiconductor, medicine, biology,
chemical, polymer materials, public security criminal investigation, agriculture,
forestry and other fields.
Scanning electron microscope can perform microscopic morphology analysis.
If equipped with other analytical instruments, conventional micro-analysis of
components can be performed, including elemental quantification and qualitative
component analysis. When performing microscopic morphology analysis, the
spatial resolution can reach sub-micron level; it can measure the state of grain
boundary, or the phase identification of crystal/grain, and the measurement of
crystal and grain orientation; Distribution measurements can be made with fast
multi-element surface scanning and line scanning.
In modern industrial production and scientific research, the development of
scanning electron microscopy has become a necessary means for material
analysis, monitoring industrial and agricultural production, ensuring product quality,
and ensuring the safety and efficiency of large production processes. At the same
time, it is related to human survival and development in biology, environmental
protection and medicine. The application of the field is also changing with each
passing day; the development of military modern high-tech (such as biological
weapons, chemical weapons wars, on-site poison detection, life support tasks, etc.)
has played a huge role.
1.3.
Model & Product Name
Product Name: Field Emission Gun Scanning Electron Microscope
Model No.
：
A63.7080
1.4.
Composition of the model No. and its representative meaning
A63 .
70
80 - X
Sub-Model No.
Model No.
Series No.
Scanning Electron Microscope
