PAMS
Technical Documentation
NSB–1/3
Troubleshooting Instructions
Page 5
Original 06/98
In cases that the flash programming doesn’t succeed there is a possibility
to check short circuits between the memories and the MCU (MAD2).
This test is useful to do, when the fault information is: MCU doesn’t boot,
Serial clock line failure or Serial data line failure.
The test procedure is following:
1. Connect the short circuit wire between the test points J206 and J207.
2. Switch power on
3. If the voltage level in testpoint J205 is 2.8 V (”1”), the interface is OK. If
there is a short circuit, the voltage level in testpoint J205 stays low and
32kHz square wave signal can be seen in the lines which are already
tested.
This test can only be used to find short circuits, not open pins. Also upper
data lines (15:8) of flash circuit D210 are not included to this test.
CCONT pin 54
( PURX )
MAD pin 38
( MCUAD0)
MAD pin 134
( ExtSysResX))
selftest
passed
J205