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MENMON
MEN Mikro Elektronik GmbH
101
20A014-00 E2 – 2007-08-16
4.5.2.2
Extended RAM Test
This full-featured memory test allows to test all RAM cells. Depending on the size
of the SO-DIMM, this test can take up to one minute.
It tests 8-, 16- or 32-bit access, each with random pattern, and single and burst
access.
On each pass, this test first fills the entire memory (starting with the lowest address)
with the selected pattern, using the selected access mode, and then verifies the entire
block.
This test is destructive.
Checks:
• All address lines
• All data lines
• All control signals
• All SDRAM cells
Does not check:
• SO-DIMM SPD EEPROM
4.5.3
EEPROM
Table 37.
MENMON – Diagnostic tests: EEPROM
This test reads the first EEPROM cell over SMB and checks if bits 3..0 of this cell
contain the magic nibble
0xD
.
Test Name
Description
Availability
EEPROM
I2C access/Magic nibble check
Groups: POST AUTO ENDLESS
Always