Lucent Technologies 4ESS SCS, Руководство по обслуживанию

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234-151-077AC DLP-517
1999 June 7, Issue 3 of 2 Page
A TABLE Dial Type Each for Word Data Third and Second in Contained Data of Description
Statement Test
TEST DIAL
STATEMENT
DESCRIPTION*
address bus buffer = C 0, = B = A CCBB
format† PUB Standard CITOPI CITOP,
address point pulse CC = C bus, reply = B chain, fault = A CLKOP
format† PUB Standard MEMOPI
accessed memory of address = 16-10 bits PUWB
level memory = 9-7 bits PUWB
map busy-idle and memories slot time For
CKT permuting and switching = 0 bit Memories
format† PUB Standard MTXMOP
test under matrix = 8-0 bits PUWB
SP: an by accessed point pulse "MA" PLOP
K-code SP = 11-2) (bits A
(1640) 0 point pulse bit to OPCODE SP = B
point of address = C
point: pulse CC by accessed point pulse "MA"
address point pulse CC = C 0, = B = A
format† PUB Standard PUDROP,PUDROPI
address point pulse CC = C 0, = B = A PULSE
statement PLOP as Same PULSI
format† PUB Standard PUOPI PUOP,
format† PUB Standard part: PUOP PUOPBBR
address bus buffer CC = C 0, = B = A part: BBR PUOPIBBR
K-code SP = 11-2) (bits A SCANI
(1540) 0 points scan read to OPCODE SP = B
point of address = C
K-code SP = 11-2) (bits A SDI
(1440) 0 points SD read to OPCODE SP = B
point of address = C
format† PUB Standard SESOP
for result expected specified = C 0, = B = A STORE
test failing VIC = B diagnostic VIC
data third and second the to C and B, A, relates format following The *
data: mismatch following words
AAAABBBB = Word Second
CCCCCCCC = Word Third
is: format Pub standard †The
PUEA/PUAB = A
OPCODE = 35-29) (bits OPAD, = 35-24) (bits PUWB = B
Address = 23-0) (bits PUWB = C
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