KYORITSU KEW 6016, Инструкция по эксплуатации

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38
However it is also good practice to consider even more stringent trip time limits, by following
the standard values of trip times at I

n defined by IEC 61009 (EN 61009) and IEC 61008 (EN
61008). These trip time limits are listed in the table below for IΔn and 5IΔn:
Type of RCD IΔn 5IΔn
General(G) 300ms
max allowed value
40ms
max allowed value
500ms
max allowed value
150ms
max allowed value
Selective(S)
130ms
min allowed value
50ms
min allowed value
Examples of instrument connections
Practical example of 3-phase + neutral RCD test in a TT system.
×1
m s
3 0 m A
2 3 0 V
L -P E
UL 5 0
V
: 0
°
5 0 .0 Hz
L-PE
L-N
!
Practical example of single phase RCD test in a TN system.
×1
m s
30 m A
230V
L-PE
U L50
V
: 0
°
50.0H z
L-PE
L-N
!
Fig.36
Fig.35