TH-K2AT/K2E/K2ET
37
ADJUSTM ENT
Item
Condition
M easurement
Adjustment
Specifications/
Test equipment
Unit
Terminal
Unit
Parts
M ethod
Remarks
Sw itch to Adjustment mode
and carry out the operations
for adjustment item D.
(Refer to page 29)
S-meter 3) LCD display: S1
SSG
TX-RX
ANT
[M ENU]
Write
Frequency: 145.050M Hz
(A/3)
(E, E3)
Frequency: 146.050M Hz
(K, K2, M , M 2)
SSG: –120dBm (0.22uV)
4) LCD display: S9
[M ENU]
Write
Frequency: 145.050M Hz
(E, E3)
Frequency: 146.050M Hz
(K, K2, M , M 2)
SSG: –105dBm (1.26uV)
4.Squelch
Squelch level: 1
Check
1) Frequency: 145.050M Hz
SSG
Check
Open Squelch
(E, E3)
Oscilloscope
Frequency: 146.050M Hz
Distortion meter
(K, K2, M , M 2)
SSG output: –123dBm (0.158uV)
SSG M OD: 1kHz
SSG DEV: 3kHz
2) SSG: OFF
Close Squelch
5.S-meter
1) Frequency: 145.050M Hz
SSG
Check
Tw o segments
Check
(E, E3)
in S-meter
Frequency: 146.050M Hz
light.
(K, K2, M , M 2)
■■
SSG output: –120dBm (0.22uV)
2) SSG output: –105dBm (1.26uV)
All segments in
S-meter light.
■■■■■■■■■
6.Hum and
1) Frequency: 145.050M Hz
SSG
TX-RX
ANT
noise ratio
(E, E3)
Oscilloscope
(A/3)
SP
Check
Frequency: 146.050M Hz
Distortion meter
(K, K2, M , M 2) AF V.M
SSG output: –53dBm (501uV)
SSG M OD: 1kHz
SSG DEV: 3kHz
AF Output: 0.63V/8
Ω
AF V.M = 0dB
2) SSG DEV: OFF
Check
–38dB or less
7.AF distortion 1) Frequency: 145.050M Hz
Check
5% or less
Check
(E, E3)
Frequency: 146.050M Hz
(K, K2, M , M 2)
SSG output: –53dBm (501uV)
SSG M OD: 1kHz
SSG DEV: 3kHz
AF Output: 0.63V/8
Ω