HP 8924E, Сборка

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Chapter 11, Block Diagrams
Introduction
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Introduction
This chapter includes detailed block diagrams and descriptions for each section of
the Test Set. It also has I/O signal and pin number information that can be used to
help isolate a problem to the assembly level if the diagnostics are unable to do so.
"Theory of Operation" on page 58
describes how the Test Set generates and
analyzes audio and RF signals, and the generation of timing references. You
should become familiar with that information before using the information in this
section.
The chapter is organized into two areas:
• Section details - graphically describes how the primary RF and AF sections of the Test
Set work together to generate and analyze signals.
• Assembly details - illustrates how each assembly works.
I/O Specifications
and Switch
Information
I/O and switch information is included for some assemblies to help you determine
if voltages and signals are getting to the assemblies with the proper levels, shapes,
and frequencies. Line names and connector pin numbers are given on the block
diagrams.