pattern can be generated independently of the main processor in the RF Section (Al5
Controller). To enable the test pattern:
a. Jumper
and
(Turns on the test ROMs.)
b. Push
to initialize.
If troubleshooting without the RF Section or with the Analyzer Bus Interconnect cable W31
disconnected,
and
must be
to turn on the power supplies.
If the CRT remains blank,
and
may have to be
to inhibit the
CRT disable line controlled by the Al5 Controller.
Figure 1. Typical Digital Storage Test Pattern
Failure Analysis and Testing Sequence
INSTR CHECK LED I and the Digital Storage test pattern can be used together to determine
in what area of the Digital Storage Section a failure exists. See “Digital Storage Failure Tests”
in this chapter. Failure symptoms (and troubleshooting information for each) are as follows:
Table l-l. Digital Storage Test Pattern
Correct
Incorrect/No
Test Pattern Test Pattern
CHECK LED I ON
See
(2)
See (1)
CHECK LED I OFF
See
(4)
See (3)
2 A3
Содержание 85662A
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Страница 294: ...2 k 4 5 7 J2 F1 TEN R91 12VTV R14 LG 20 A4A2 Log Amplifier Detector Component Locations 85662 60132 ...
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Страница 365: ...A4A8A2 Down Converter Component Locations 85662 60005 ...
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Страница 379: ...c40 c 4 1 PK SYM y Hz A M P L 10 Hz AMPL A4A7 3 MHz Bandwidth Filter Component Locations 85662 60004 85662 60174 ...
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Страница 409: ...Table 4 Video Bandwidth Truth Table 6 A4A9 ...
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Страница 452: ...A4A6A2 Output Driver Component Locations 85662 60170 Option 067 Tab ...
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Страница 473: ...Table 4 Video Bandwidth Truth Table Option H96 3 ...
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Страница 594: ...HEWLETT PACKARD HP Part No 85662 90085 Printed in USA ...