22
Plasma TV Service Manual
11/01/2005
square wave clock signal
TDI
B5
I/pu
test data input for boundary scan test; note 2
TCK
B6
I/pu
test clock for boundary scan test; note 2
XDQ
B7
I/O
data qualifier for expansion port
XPD1
B8
I/O
MSB - 6 of expansion port data
XPD3
B9
I/O
MSB - 4 of expansion port data
XPD5
B10
I/O
MSB - 2 of expansion port data
XTRI
B11
I
X-port output control signal, affects all X-port pins (XPD7 to
XPD0, XRH, XRV, XDQ and XCLK), enable and active
polarity is under software control (bits XPE in subaddress
83H)
TEST4
B12
O
do not connect, reserved for future extensions and for testing:
scan output
TEST5
B13
NC
do not connect, reserved for future extensions and for testing
TEST6
B14
NC
do not connect, reserved for future extensions and for testing
VSSA4
C1
P
ground for analog inputs AI4x
AGND
C2
P
analog ground
TEST7
C3
NC
do not connect, reserved for future extensions and for testing
TEST8
C4
NC
do not connect, reserved for future extensions and for testing
V
DDD1
C5
P
Digital supply voltage 1 (peripheral cells)
TRST
C6
I/pu
test reset input (active LOW), for boundary scan test (with
internal pull-up); notes 2, 3 and 4
XRH
C7
I/O
horizontal reference I/O expansion port
V
DDD2
C8
P
Digital supply voltage 2 (core)
V
DDD3
C9
P
Digital supply voltage 3 (peripheral cells)
V
DDD4
C10
P
Digital supply voltage 4 (core)
XPD7
C11
I/O
MSB of expansion port data
TEST9
C12
NC
do not connect, reserved for future extensions and for testing
TEST10
C13
NC
do not connect, reserved for future extensions and for testing
TEST11
C14
I/pu
do not connect, reserved for future extensions and for testing:
scan input
AI43
D1
I
analog input 43
AI42
D2
I
analog input 42
AI4D
D3
I
differential input for ADC channel 4 (pins AI41 to AI44)
V
DDA4
D4
P
analog supply voltage for analog inputs AI4x (3.3 V)
V
SSD1
D5
P
Digital ground 1 (peripheral cells)
TMS
D6
I/pu
test mode select input for boundary scan test or scan test;
note 2
V
SSD2
D7
P
Digital ground 2 (core; substrate connection)
XRV
D8
I/O
vertical reference I/O expansion port
V
SSD3
D9
P
Digital ground 3 (peripheral cells)
V
SSD4
D10
P
Digital ground 4 (core)
V
SSD5
D11
P
Digital ground 5 (peripheral cells)
V
DDD5
D12
P
Digital supply voltage 5 (peripheral cells)
TEST12
D13
I/pu
do not connect, reserved for future extensions and for testing:
scan input
HPD0
D14
I/O
LSB of host port data I/O, extended C
B
-C
R
input for
expansion port, extended C
B
-C
R
output for image port
AI44
E1
I
analog input 44
V
DDA4A
E2
P
analog supply voltage for analog inputs AI4x (3.3 V)
AI31
E3
I
analog input 31
V
SSA3
E4
P
ground for analog inputs AI3x
HPD1
E11
I/O
MSB - 6 of host port data I/O, extended C
B
-C
R
input for
expansion port, extended C
B
-C
R
output for image port
HPD3
E12
I/O
MSB - 4 of host port data I/O, extended C
B
-C
R
input for
expansion port, extended C
B
-C
R
output for image port
HPD2
E13
I/O
MSB - 5 of host port data I/O, extended C
B
-C
R
input for
expansion port, extended C
B
-C
R
output for image port
HPD4
E14
I/O
MSB - 3 of host port data I/O, extended C
B
-C
R
input for
expansion port, extended C
B
-C
R
output for image port
AI3D
F1
I/O
differential input for ADC channel 3 (pins AI31 to AI34)
AI32
F2
I
analog input 32
AI33
F3
I
analog input 33
V
DDA3
F4
P
analog supply voltage for analog inputs AI3x (3.3 V)
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