SPECORD PLUS
Design and function
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In the photometer chamber of the SPECORD 200/210/250 PLUS, the fixed 50/50
beam divider splits the beam arriving from the monochromator into a measuring and
reference beam. The SPECORD 50 PLUS uses the portion of the radiation reflected on a
quartz plate as an internal reference to compensate for intensity fluctuations. The imag-
ing mirrors generate the necessary beam cross-sections in the sample chamber.
Sample chamber
The large sample chamber of the SPECORD PLUS
has a variable design. The measuring
and reference beam enter the sample chamber of the SPECORD 200/210/250 PLUS
from the rear. Two windows protect the photometer chamber against dust and contami-
nation from reagents.
In the SPECORD 50, the high energy measuring beam goes though the middle of the
sample chamber. The reference beam for compensating energy fluctuations is directed
internally to the receiver diode.
The holders for standard cells are slid directly into the adapter plates on the front sam-
ple chamber wall and are located close to the receiver. Cells with opaque samples of
10 mm layer thickness can be placed in special cuvette ducts directly in front of the re-
ceiver.
As an optical bench, the support rod system provides space for large accessories, e.g.,
the 8-cell changer or the integrating sphere. Additionally, your own experimental con-
structs can be placed in the sample chamber in an optically reproducible manner and ex-
changed.
In the right sample chamber wall are the connection sockets for the electrical accessories
or the identification connectors for the accessories.
Two large ducts closed with plugs are located at the bottom of the front sample cham-
ber wall. The waste hose of the sipper system or the hoses for temperature-controlled
accessories can be routed through these ducts. Other ducts of varying sizes are located in
both the left and right sample chamber walls. These are closed via white plugs in a rub-
ber plug. The connection hoses for the sipper system, temperature-controlled acces-
sories and optical cables for external sample probes can be routed through these ducts.
After removing the attachment screws, the side components of the sample chamber can
be removed and exchanged to convert the spectrometer to a flow measurement system
or to use air-cooled Peltier accessories.
The beam paths in the SPECORD PLUS and the connections for the electrical accessories
are marked:
¡
"M" – Measuring beam path or connection for accessories in the measuring beam
path
¡
"R" – Reference beam path or connection for accessories in the reference beam path
