15
Diode test. Voltage measurement at the
semiconductor junction in forward bias.
TEMP
Temperatures up to 1000°C or 2000°F
(with K type thermocouple)
40 µF
Capacity up to 40 µF
400 µF
Capacity up to 400 µF
4000 µF
Capacity up to 4000 µF
µA
400 µA range ... and ~
➃
➃
➃
➃
➃
4 mm Ø SAFETY TERMINALS:
- COM : common terminal taking the black lead
- +
: terminal taking the red lead
- µA TEMP: terminal taking the red lead for current,
capacitance and temperature measurement.
3. AC AND DC VOLTAGES
■
Select the V function.
■
Connect leads to multimeter and connect in parallel on
the circuit undergoing measurement.
■
Automatic range selection : read off the value.
■
To store the value in memory, press the HOLD button.
If necessary, press the following buttons:
■
MIN-MAX for min. and max. values (see § 2 Description
: MIN - MAX)
■
to light up display
V
...
/
~
400 mV
*
4V
40 V
400 V
600 V
Digital
resolution
0.1 mV
1 mV
10 mV
100 mV
1 V
Impedance
10 M
Ω
Accuracy
± 1% R ± 1 ct
in
...
Accuracy
± 1.5% R ± 5 ct
in ~
Permitted
600 V eff. and 900 V peak
Overload
Frequency range: 40 Hz to 500 Hz (4 V...600 V)
*
Frequency range on 400 mV range: 40 Hz to 100 Hz
