System Overview
2-1
2
S
YSTEM
O
VERVIEW
The DektakXT
®
stylus surface profiler is an advanced thin and thick film step height measurement
tool. In addition to profiling surface topography and waviness, the DektakXT system measures
roughness in the nanometer range. Available with a standard manual sample-positioning stage (see
) or an optional automatic X-Y or theta stage (see
), it provides a step-height
repeatability of 5Å (<0.6 nm).
In addition to taking two-dimensional surface profile measurements, the DektakXT system can
produce three-dimensional measurements and analyses when equipped with the 3D Mapping Option.
Figure 2-1: DektakXT Stylus Profiler with the Standard Manual X-Y Sample-Positioning Stage
Hood-covered
measurement
head that
includes the
tower, camera,
illuminator, and
sensor
Scan stage
System base
Sensor head and
stylus
Manual sample-
positioning stage
Block sample
fixture (chuck)
Base foot
Bridge
Содержание DektakXT
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Страница 8: ...Table of Contents v Applying Filters 5 11 Performing Analyses 5 12 3D Mapping Optiion 5 13 ...
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Страница 71: ...5 4 Using Vision64 Figure 5 4 Measurement Setup Vision View Figure 5 5 Automation Setup Vision View ...
Страница 72: ...Using Vision64 5 5 Figure 5 6 Data Acquisiton Vision View Figure 5 7 Data Analysis Vision View ...
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