Allied Telesis AT-ANC10S/4, Руководство по установке

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AT-ANC10S/2 and AT-ANC10S/4 Adapters Installation and User’s Guide
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Diagnostic Test Descriptions
The diagnostic tests are divided into four groups:
 Basic Functional Tests (Group A)
 Memory Tests (Group B)
 Block Tests (Group C)
 Ethernet Traffic Tests (Group D).
The diagnostic tests are described in Table 11.
Table 11. Diagnostic Tests
Test
Description
Number Name
Group A: Basic Functional Tests
A1 Register Verifies that registers accessible through the
PCI/PCI-E interface implement the expected
read-only or read/write attributes by
attempting to modify those registers.
A2 PCI Configuration Checks the functionality of the PCI Base
Address Register (BAR) by varying the
amount of memory requested by the BAR and
verifying that the BAR actually requests the
correct amount of memory (without actually
mapping the BAR into system memory). Refer
to PCI or PCI-E specifications for details on
the BAR and its addressing space.
A3 Interrupt Generates a PCI interrupt and verifies that the
system receives the interrupt and invokes the
correct ISR. A negative test is also performed
to verify that a masked interrupt does not
invoke the ISR.
A5 MSI Verifies that a Message Signaled Interrupt
(MSI) causes an MSI message to be DMA'd to
host memory. A negative test is also
performed to verify that when an MSI is
masked, it does not write an MSI message to
host memory.
A6 Memory BIST Invokes the internal chip Built-In Self Test
(BIST) command to test internal memory.