Alcatel-Lucent 1850 TSS-320, Руководство по пусконаладке и вводу в эксплуатацию, Страница: 75 / 140

Local testing and operating sequence Tests and Measurements
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PN 8DG08136CAAA
Issue 1 March 2008
3-49
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Protection test Matrix/CRU EPS
Purpose :
•
Check that EPS is working properly
•
Check that following switching no data has been lost apart from an initial transient
state.
Test instruments [see Table 3-1, “Instruments” (p. 3-2) ]
•
Craft terminal (E)
•
Pattern generator/error detector (A)
Accessories [see Table 3-2, “Accessories” (p. 3-2) ]
•
Optical loop (K)
•
Single-mode single-fiber splices (I) or (Q), according to the interface type
•
Craft Terminal cable (L)
Test Bench:
Figure 3-16 Matrix/CRU EPS protection check
Note:
The figure can change depending on the type of tributary port and on the line
port selected.
For the 1850 TSS-320 shelf configuration, refer to Figure 3-5 on p. 3-22 .
Procedure
Perform the same cross connection used for the previous SNCP protection test.
a. Preset the instrument to transmit a signal with the following requirements:
b. Check that no errors are read on the Error Detector.
Bit rate 155520 kbit/s
Code/interface (SFP) S-1.1, L-1.1, L-1.2 See Chapter 4 , “SFP and XFP modules
optical characteristics” (p. 4-16) .
Type OC-3 optical
BLOCK DIAGRAM
1850 TSS-320
Loop
STS-3c
STM-1
port
Pattern Generator
Error Detector
LINE
port
"A"
LINE
port
"B"
Loop
Matrix "B"
Matrix "A"