![Agilent Technologies 4352B Скачать руководство пользователя страница 173](http://html.mh-extra.com/html/agilent-technologies/4352b/4352b_service-manual_2867893173.webp)
The
power
on
self-test
consists
of
A1
CPU
DRAM
write/read
test,
Dual
P
ort
SRAM
write/read
test,
and
the
internal
test
4:
[A2]
POST
REGULA
TOR.
If
the
test
fails
,
a
\PO
WER
ON
TEST
F
AILED"
message
is
displayed
at
the
end
of
the
power
on
sequence
.
Internal
T
ests
These
tests
are
completely
internally
and
are
self-evaluating.
They
do
not
require
external
connections
or
user
interaction.
The
analyzer
has
4
internal
tests
.
External
T
ests
These
are
additional
self-evaluating
tests
.
However
,
these
tests
require
some
user
interaction
(such
as
key
entries).
The
analyzer
has
3
external
tests
.
Display
T
ests
These
tests
are
used
to
check
for
proper
operation
of
the
display
circuits
.
The
analyzer
has
5
display
tests
.
T
est
Descriptions
This
section
describes
all
12
diagnostic
tests
.
N
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
INTERNAL
TESTS
This
group
of
tests
run
without
external
connections
or
operator
interaction.
All
return
a
\P
ASS"
or
\F
AIL"
indication
on
the
display
.
Except
as
noted,
all
are
run
during
the
power
on
self-test
and
when
4
Preset
5
pressed.
0:
ALL
INT
Runs
only
when
selected.
It
consists
of
internal
tests
(1,
4).
If
any
of
these
tests
fail,
this
test
displays
the
\F
AIL"
status
indication.
Use
the
RPG
knob
to
scroll
through
the
tests
to
see
which
test
failed.
If
all
pass
,
the
test
displays
the
\P
ASS"
status
indication.
Each
test
in
the
subset
retains
its
own
test
status
.
1:
A1
CPU
V
eries
the
following
circuit
blocks
on
the
A1
CPU:
Flash
Memory
Check
Sum
Digital
Signal
Processor
(DSP)
System
Timer
Real
Time
Clock
Front
Key
Controller
Flexible
Disk
Drive
Controller
GPIB
Controller
mini-DIN
Chip
EEPROM
2:
A1
V
OLA
TILE
MEMORY
Runs
only
when
selected.
It
veries
the
A1
volatile
memories:
CPU
internal
SRAM
DSP
SRAM
Dual
P
ort
SRAM
Backup
SRAM
At
the
end
of
the
test,
the
analyzer
is
set
to
the
power-on
default
state
because
the
data
in
the
tested
memories
has
been
destroyed.
During
this
test,
a
test
pattern
is
written
into
the
memories
and
then
the
pattern
is
read
back
and
checked.
9-8
Service
K
ey
Menus
Содержание 4352B
Страница 11: ......
Страница 31: ......
Страница 73: ......
Страница 80: ...Figure 3 4 List Box Menu Adjustments and Correction Constants 3 7 ...
Страница 82: ...Figure 3 6 Reference Frequency Adjustment Location Adjustments and Correction Constants 3 9 ...
Страница 85: ...Figure 3 9 Third IF AMP GAIN Adjustment Location 3 12 Adjustments and Correction Constants ...
Страница 103: ...Figure 4 1 Troubleshooting Organization 4 2 Overall T roubleshooting ...
Страница 113: ......
Страница 130: ...Figure 5 11 Power Supply Block Diagram 1 Power Supply T roubleshooting 5 17 ...
Страница 131: ...Figure 5 12 Power Supply Block Diagram 2 5 18 Power Supply T roubleshooting ...
Страница 132: ...Figure 5 13 Power Supply Block Diagram 3 Power Supply T roubleshooting 5 19 ...
Страница 133: ......
Страница 135: ...Figure 6 1 Digital Control Group Simpli ed Block Diagram 6 2 Digital Control T roubleshooting ...
Страница 146: ...Figure 7 2 Source Group Troubleshooting Flow Source Group T roubleshooting 7 3 ...
Страница 154: ...Figure 8 2 Receiver Group Troubleshooting Flow Receiver Group T roubleshooting 8 3 ...
Страница 198: ...Figure 10 1 Power Supply Functional Group Simpli ed Block Diagram Theory of Operation 10 3 ...
Страница 203: ...Figure 10 3 Digital Control Group Simpli ed Block Diagram 10 8 Theory of Operation ...
Страница 269: ......
Страница 272: ...Figure B 1 Power Cable Supplied Power Requirement B 3 ...
Страница 273: ......
Страница 293: ...Error Messages Numerical Order 0400 Query error 0410 Query INTERRUPTED 0420 Query UNTERMINATED Messages 20 ...