Agilent Technologies 1141A, Руководство пользователя и сервисное руководство

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Adjusting the Probe 3
Probe Adjustment
1141A and 1142A User’s Guide 45
Probe Adjustment
This procedure adjust the high- frequency and low- frequency paths
on the 1141A Differential Probe.
Table 11 shows the equipment
required for this procedure. Procedures are based on the model or
part number recommended.
NOTE
Do not perform this procedure as a part of routine maintenance. Perform the
procedure only if the probe does not meet specifications or has been repaired.
CAUTION
You are going to remove the covers of the probe, so the assembly inside will be
exposed while under power. The PC assembly will be electrically and mechanically
vulnerable.
CAUTION
Do these adjustment procedures in an ESD-safe area.
CAUTION
Avoid inadvertent contact between the powered assembly and nearby tools and
equipment.
CAUTION
Avoid mechanical damage by carefully handling the exposed assembly and cables.
Step 1. Probe Preparation
Unless specified elsewhere, the following sections in this procedure
must be followed in the order given. The only adjustment which
may be done separately is
HF COMP , the high- frequency
compensation.
Table 11 Equipment Required
Equipment Required Critical Specifications Recommended
Agilent
Model/Part
Function Generator 2.5 kHz, 1 V
p-p
33120A
Oscilloscope 300 MHz at 1 mV/div 54830B
Signal Generator 200 MHz at
≈
300 mVrms 8648A
Test Board No substitute 01141-66504
Cables (2) BNC, 50
Ω
10503A
Adapter Type N (m) to BNC (f) 1250-0780