Advantech AIMB-562 series, Руководство пользователя

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GESTEK
Lab
Report No.: 0609083 Rev. 1
N0 3, Pau-Tou-Tsuo Valley, Chia-Pau Tsuen, Lin Kou Hsiang, Taipei County, Taiwan, R.O.C. Tel:886-2-2603-5321 Fax:886-2-2603-5325
Accredited Lab. Of BSMI, NEMKO, NVLAP Page 2 of 59
Listed Lab. of AUSTEL, Commerce, FCC, VCCI NVLAP Lab Code:200085-0
TA B L E O F C O N T E N T S
Description Page
1. CERTIFICATION 3
2. SUMMARY OF TEST RESULTS 4
3. GENERAL INFORMATION 5
3.1 PRODUCT DESCRIPTION 5
3.2 TEST MODES & EUT COMPONENTS DESCRIPTION 5
3.3 CONFIGURATION OF THE SYSTEM UNDER TEST 6
3.4 TEST FACILITY 10
4. CONDUCTED EMISSION MEASUREMENT 11
4.1 TEST EQUIPMENTS 11
4.2 TEST METHOD 11
4.3 BLOCK DIAGRAM OF TEST SETUP 11
4.4 CONDUCTED EMISSION LIMITS 12
4.5 EUT CONFIGURATION ON MEASUREMENT 12
4.6 CONDUCTED EMISSION DATA 12
4.7 OPERATING CONDITIONS OF THE EUT 12
4.8 CONDUCTED EMISSION MEASUREMENT RESULTS 13
5. RADIATED EMISSION MEASUREMENT 15
5.1 TEST EQUIPMENT 15
5.2 TEST METHOD 15
5.3 BLOCK DIAGRAM OF TEST SETUP 16
5.4 RADIATED EMISSION LIMITS 17
5.5 EUT CONFIGURATION 18
5.6 OPERATING CONDITIONS OF THE EUT 18
5.7 RADIATED EMISSION DATA 18
5.8 RADIATED EMISSIONS MEASUREMENT RESULTS 19
6. HARMONIC CURRENT EMISSIONS, VOLTAGE
FLUCTUATIONS AND FLICKER MEASUREMENT
22
6.1 TEST EQUIPMENT 22
6.2 TEST METHOD 22
6.3 BLOCK DIAGRAM OF TEST SETUP 22
6.4 LIMITS OF HARMONIC CURRENT EMISSIONS 23
6.5 OPERATING CONDITIONS OF THE EUT 23
6.6 TEST PROCEDURE 23
6.7 TEST RESULT 23
7. ESD IMMUNITY TEST 26
7.1 TEST EQUIPMENT 26
7.2 TEST METHOD 26
7.3 BLOCK DIAGRAM OF TEST SETUP 26
7.4 SEVERITY LEVELS 27
7.5 OPERATING CONDITIONS OF THE EUT 27
7.6 TEST PROCEDURE 27
7.7 TEST RESULT 28
8. RF FIELD STRENGTH SUSCEPTIBILITY TEST 29
8.1 TEST EQUIPMENT 29
8.2 TEST METHOD 29
8.3 BLOCK DIAGRAM OF TEST SETUP 29
8.4 SEVERITY LEVELS 30
8.5 OPERATING CONDITIONS OF THE EUT 30
8.6 TEST PROCEDURE 30
8.7 TEST RESULT 31
9. ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST32
9.1 TEST EQUIPMENT 32
9.2 TEST METHOD 32
9.3 BLOCK DIAGRAM OF TEST SETUP 32
9.4 SEVERITY LEVELS 33
9.5 OPERATING CONDITIONS OF THE EUT 33
9.6 TEST RESULT 34
10. SURGE IMMUNITY TEST 35
10.1 TEST EQUIPMENT 35
10.2 TEST METHOD 35
10.3 BLOCK DIAGRAM OF TEST SETUP 35
10.4 SEVERITY LEVELS 35
10.5 OPERATING CONDITIONS OF THE EUT 36
10.6 TEST PROCEDURE 36
10.7 TEST RESULT 37
11. CONDUCTED DISTURBANCE SUSCEPTIBILITY TEST 38
11.1 TEST EQUIPMENT 38
11.2 TEST METHOD 38
11.3 BLOCK DIAGRAM OF TEST SETUP 38
11.4 SEVERITY LEVELS 38
11.5 OPERATING CONDITIONS OF THE EUT 38
11.6 TEST PROCEDURE 39
11.7 TEST RESULT 40
12. VOLTAGE DIPS AND SHORT INTERRUPTIONS TEST 41
12.1 TEST EQUIPMENT 41
12.2 TEST METHOD 41
12.3 BLOCK DIAGRAM OF TEST SETUP 41
12.4 SEVERITY LEVELS 41
12.5 OPERATING CONDITIONS OF THE EUT 41
12.6 TEST PROCEDURE 41
12.7 TEST RESULT 42
13. PHOTOGRAPHS FOR TEST 43
13.1 TEST PHOTOGRAPHS FOR CONDUCTION 43
13.2 TEST PHOTOGRAPHS FOR RADIATED 44
13.3 TEST PHOTOGRAPHS FOR HARMONIC/FLICKER 45
13.4 TEST PHOTOGRAPHS FOR ESD 46
13.5 TEST PHOTOGRAPHS FOR ESD TEST POINTS 47
13.6 TEST PHOTOGRAPHS FOR RS 48
13.7 TEST PHOTOGRAPHS FOR EFT 49
13.8 TEST PHOTOGRAPHS FOR SURGE 50
13.9 TEST PHOTOGRAPHS FOR CS 51
13.10 TEST PHOTOGRAPHS FOR DIPS 52
14. PHOTOGRAPHS FOR PRODUCT 53
15. EMI/EMS REDUCTION METHOD DURING COMPLIANCE
TESTING 59