Vishay Micro-Measurements
System 7000 Programmer’s Reference Manual
Page 51 of 142
LabVIEW
CalculateStrainGageCalibrationFactor VI
(all of the data scaling VIs have an input for the calibration
factor(s))
Active X
ShuntCalEnable method
RemoeCalEnable method
GetStaticADCReading
Low-level
Shunt Calibration Resistor Enable/Disable command
Remote Calibration Resistor Enable/Disable command
Asynchronous Read A/D Converter command
3.17 Scaling the Analog-to-Digital Converter Counts
The values provided by the System 7000 are in 32-bit, analog-to-digital converter counts. The readings
are not in “raw” ADC counts but have been corrected based on the channel’s current calibration settings.
Strain Gage Readings
1 count = 0.5µ
ε
, or 0.25µV/V
Typically the strain gage reading is scaled according to the following formulas:
microStrain = (((ADC_Count – Zero_Reading) / 2) * Calibration_Factor)
milliVolt_per_Volt = (microStrain * (Gage_Factor * 10**03)) / 4
Scaling for thermal effects, rosette calculations, etc. is beyond the scope of this manual.
High-Level Readings
1 count = 100µV
Linearization and other scaling are beyond this scope of this manual, please see the
specifications for your sensor.
Thermocouple Readings
1 count = 1µV
To convert the µV readings to temperature units, please see the “NIST Monograph 175” for a
database and calculations.
LVDT Readings
1 count = 50 µV
rms
Linearization and other scaling are beyond this scope of this manual, please see the
specifications for your sensor.
LabVIEW
Note: all of the conversion VIs are polymorphic
Convert Strain Gage Reading VI
Convert Thermocouple Reading VI
Convert High Level Reading VI
Convert LVDT Reading VI
Active X
Scaling is done programmatically by the user
Low-level
Scaling is done programmatically by the user
