Overview
4
Overview
This section describes the meaning of each of the options on each tab. Remember, checking an option
does not immediately cause that option to be set. It is only set after a "Write" button click is performed.
Any changes that have occurred on the part, like new status, will not be visible until a "Read" button click
has been done.
4.1
Typical Sequence
In a typical sequence (for example, to do a thermistor measurement) follow these steps. These steps are
more fully described in the
RF430FRL15xH Firmware User's Guide
(
1. Configure the thermistor measurement parameters:
(a) Select the thermistor sensor.
(b) Set how many times it needs to be sampled.
(c) If sampled more than one time, select the delay between the samples.
(d) Select the ADC configuration (resolution, PGA setting, and type of filter).
These settings are written to the virtual registers in the FRAM memory using RF communication.
2. Write the start bit in the control register to start the sampling process.
3. There is a delay while the sampling process is being performed.
4. After sampling is complete, the requested measurements are stored into the log memory, typically
FRAM (after the virtual registers).
4.2
Setup Tab
This tab is largely self-explanatory. First, in the "Device Interface Selection" select the board that is being
used.
If the RF430FRL152HEVM is selected, an option to select whether or not a Sensor Hub BoosterPack is
being used is presented. Make the selection (see
).
Figure 7. Setup Tab
9
SLAU607 – December 2014
RF430FRL152HEVM User's Guide
Copyright © 2014, Texas Instruments Incorporated
