Tektronix 071-0130-00, User Manual, Page: 263 / 376

Using Features for Advanced Applications
3–202
TDS 500D, TDS 600B, & TDS 700D User Manual
Figure 3–92: Comparing a Waveform to a Limit Template
To do the tasks just listed, do the following procedures:
To use an incoming or stored waveform to create the limit test template, first you
select a source and specify a template destination. Then you create the template
envelope by specifying the amount of variation from template you will tolerate.
To do these tasks, perform the following steps:
1. Press SHIFT ACQUIRE MENU to bring up the Acquire menu.
2. Press Create Limit Test Template (main)
➞
Template Source (side)
➞
Ch1, Ch2, Math1, Math2, Math3, Ref1, Ref2, Ref3, or Ref4 (side). (See
Figure 3–93.)
NOTE
. The template will be smoother if you acquire the template waveform using
Average acquisition mode. If you are unsure how to select Average, see Selecting
an Acquisition Mode on page 3–35.
3. Once you have selected a source, select a destination for the template: press
Template Destination (side)
➞
Ref1, Ref2, Ref3, or Ref4.
To Create Limit Test
Template