Tektronix 071-0130-00, User Manual, Page: 21 / 376

Product Description
1–2
TDS 500D, TDS 600B, & TDS 700D User Manual
Advanced features include limit testing (see Limit Testing on page 3–201),
FFT (see Fast Fourier Transforms on page 3–209), waveform differentiation
and integrations (see Waveform Differentiation and Waveform Integration
starting on page 3–228), mask testing (see Mask Testing on page 3–148),
waveform histograms (see Displaying Histograms on page 3–145), and
communications signal analysis (see Communication Triggers on
page 3–113, Mask Testing on page 3–148, and options 2C, 3C, and 4C on
page A–2)
Adjustable channel deskew for increased measurement accuracy (see
Channel/Probe Deskew on page 3–158)
Full GPIB programmability (see Communicating with Remote Instruments
on page 3–191 and the TDS Family Programmer Manual disk)
Wide array of probing solutions (see Accessory Probes on page A–6 and
Probe Selection on page D–1)
CE, FCC, UL, and CAN/CSE compliant (see TDS 500D, TDS600B &
TDS 700D Technical Reference manual)
Four channel or 2 + 2 channel operation, depending on the model. All
channels have 8-bit resolution. (See Table 1–1 on page 1–3.)
Dual Window Zoom, which shows a waveform magnified and unmagnified
on the same display (see Using Dual Window Mode on page 3–56)
Sample, envelope, average, high res, peak-detect and DPO acquisition modes
(see Table 1–1, on page 1–3, for models and modes available)