Paradyne COMSPHERE 3550 Series, User Manual

Page: 46 / 153

COMSPHERE 3550 Series Data Service Units
3-12 July 1999 3550-A2-GB20-40
Other Tests
The following lists the tests available on your DSU.
Refer to the Test Branch section of Chapter 4 for further
test information, as well as more detail on how to
configure and operate the DSU. Refer to
Appendix A to
determine how best to access each test.
•
Device Test (Devic)
•
Local Loopback (LL)
•
DTE Loopback (DTE)
•
Digital Loopback (DL)
•
Remote Digital Loopback (RL)
•
Bilateral Loopback
•
Digital Test (DT)
•
End-to-End Test (EE)
•
Bit Error Rate Test (BERT)
•
Lamp Test (Lamp)