NXP Semiconductors Boundary Scan, Manual

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Figure 1. Boundary scan principle
1.2 Test Access Port (TAP) JTAG
The TAP is a general-purpose port and it can provide access to many test support functions built into the component. It has four
or five signals, as described in
Table 1 .
NXP Semiconductors
Overview
Introduction to Boundary Scan of i.MX RT Series, Rev. 1, March 2, 2021
Application Note 2 / 15