AN10907
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© NXP B.V. 2010. All rights reserved.
Application note
Rev. 1 — 28 December 2010
73 of 82
NXP Semiconductors
AN10907
TEA1613T resonant power supply control IC
12. Application examples and topologies
12.1 Example of IC evaluation and test setup
An example of a test/evaluation setup is provided in
. This setup can be used to:
•
check if an IC is still functional (not defective)
•
evaluate specific IC function(s) or pin properties with limited interference from the total
system
Fig 57. Example of a basic IC test setup on a single low voltage supply (24 V)
019aaa264
SUPIC
SUPIC
EXT. SUPPLY
EXT. SUPPLY
SNSOUT/PFCON
ON/OFF
SNSFB
SNSBURST
SNSBOOST
SUPIC
PGND
SUPREG
GATELS
180 k
Ω
0
Ω
2 k
Ω
10 k
Ω
4.7 k
Ω
200
Ω
620 k
Ω
24 k
Ω
300 k
Ω
82 k
Ω
47 k
Ω
1 k
Ω
10 k
Ω
4.7 nF
1 F
47 nF
470 pF
24 k
Ω
all off
330 k
Ω
100
μ
F
4.7
μ
F
470 nF
TEA1613
NC
SUPHV
RCPROT
SSHBC/EN
RFMAX
CFMIN
SGND
SNSCURHBC
NC
n.c.
HB
SUPHS
GATEHS
SUPIC
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
n.c.
15 nF
100
μ
F
330 nF
470 pF
1 F
100
μ
H
1
Ω
BYV27-400
04N60C3
04N60C3
