Table 1.
NI 5170R Test Equipment (Continued)
Equipment
Recommended
Model
Where Used
Minimum Requirements
SMA (f)-to-N
(m) adapter
Fairview Microwave
SM4226
Test system
characterization
Verifications:
•
Flatness and
bandwidth
Frequency range: DC to
275 MHz
VSWR: <1.05
Impedance: 50 Ω
SMA (f)-to-N (f)
adapter
Fairview Microwave
SM4236
Test system
characterization
Verifications:
•
Flatness and
bandwidth
Frequency range: DC to
275 MHz
VSWR: <1.05
Impedance: 50 Ω
Related Information
This section provides instructions for verifying the device specifications.
Test Conditions
The following setup and environmental conditions are required to ensure the NI 5170R meets
published specifications:
•
The NI 5170R is warmed up for 15 minutes at ambient temperature. Warm-up begins
after the chassis is powered, the device is recognized by the host, and the ADC clock is
configured using either instrument design libraries or the NI-SCOPE device driver.
•
Keep cabling as short as possible. Long cables act as antennas, picking up extra noise that
can affect measurements.
•
Verify that all connections to the device, including front panel connections and screws,
are secure.
•
Use shielded copper wire for all cable connections to the device. Use twisted-pair wire to
eliminate noise and thermal offsets.
•
Maintain an ambient temperature of 23 °C ± 3 °C
•
Keep relative humidity between 10% and 90%, noncondensing.
•
Ensure that the PXI chassis fan speed is set to HIGH, that the fan filters (if present) are
clean, and that the empty slots contain slot blockers and filler panels. For more
NI PXIe-5170R Calibration Procedure
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© National Instruments
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