National Semiconductor DS25CP104, User Manual

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DS25CP104EVK User Manual
Jitter Performance Testing with No Signal Conditioning
1.
Configure the test setup as shown in Figure 4.
2.
Set the desired INn to OUTn drivers by selecting S00, S01, S10, S11, S20, S21,
S30, S31 according to Tables 1 – 4.
3. Select the PEn and EQn jumpers to 0, according to tables 5 and 6.
4. Apply + supply (3.3V typical) to the VDD and – supply (ground) to the VSS
connectors.
5. Connect a signal source (signal generator, data source, or an LVDS driver) to the
desired INn inputs on the board and adjust the signal parameters (VOH, VOL,
VCM) so that they comply with the device input recommendations.
6.
Connect an oscilloscope to the selected OUTn outputs and view the output signals
with an oscilloscope with the bandwidth of at least 5 GHz.
Figure 4 . Jitter Performance Test Circuit
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