Index
©
National Instruments Corporation
I-7
K
L
LabVIEW
M
meas
u
rements
ffered two-signal edge-separation, 8-20
semi-period, 8-8
single period, 8-6
single p
single semi-period, 8-8
single two-signal edge-separation, 8-20
two-signal edge-separation, 8-19
meas
u
ring
methods, data transfer, 11-1
minimizing
mo
u
ltichannel scanning considerations, 4-5
N
NI-DAQmx
NI-PGIA, 4-2
non-referenced single-ended connections