DEVICE SPECIFICATIONS
PXIe-6570
32-Channel Digital Pattern Instrument
This document lists the specifications for the PXIe-6570. When using the PXIe-6570 in the
Semiconductor Test System, refer to the
Semiconductor Test System Specifications
.
Specifications are subject to change without notice. Refer to
recent specifications.
NI defines the capabilities and performance of its Test & Measurement instruments as
Warranted
specifications,
Typical
specifications, and
Characteristics
.
Warranted
specifications describe the warranted, traceable product performance, including the
effects of temperature and uncertainty unless otherwise noted.
Typical
specifications are unwarranted values that are representative of a majority of units,
including the effects of temperature and uncertainty unless otherwise noted.
Characteristics
are unwarranted values that are relevant to the use of the product and convey
the expected performance of the product.
Specifications in this document are
Characteristics
unless otherwise noted. Specifications are
valid under the following conditions unless otherwise noted:
•
0 °C to 45 °C operating temperature.
•
Accuracy specifications are valid within ±5 ºC of the last self-calibration temperature.
•
The PXIe-6570 is within the 1 year recommended calibration interval.
•
The DUT Ground Sense (DGS) is the same potential as the Ground (GND) pins.
Note
The DGS feature is only available on PXIe-6570 module revisions
158234
C
-
xx
L or later.
•
Chassis fans are set to the highest setting if the PXI Express chassis supports multiple
fans speeds.
•
Allow a 30 minute warm-up time.
Caution
Do not operate the PXIe-6570 in a manner not specified in the user
documentation. Product misuse can result in a hazard. You can compromise the
safety protection built into the product if the product is damaged in any way. If the
product is damaged, return it to NI for repair.
