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National Instruments
13
NI PXIe-4353 Calibration Procedure
Test Limits
Tables 4 through 7 list the specifications that the NI PXIe-4353 module or NI PXIe-4353 and TB-4353
system should meet if it has been one year between calibrations. The following definitions describe how
to use the information from these tables:
•
Test Point
—The voltage value that is input or output for verification purposes. This value is broken
down into two columns,
Location
and
Value
.
Location
refers to where the test value fits within the
test range.
Value
refers to the voltage or temperature value to be verified. Max refers to maximum
value, Min refers to minimum value, and Mid refers to mid-scale.
•
1-Year Limits
—Contains the
Upper Limits
and
Lower Limits
for the test point value. That is, when
the module is within its 1-year calibration interval, the test point value should fall between these
upper and lower limit values.
Module Verification Test Limit Tables
Table 4.
NI PXIe-4353 Analog Input Voltage Accuracy Verification Test Limits
Timing Mode
Test Point
1-Year Limits (V)
Location
Value (V)
Lower Limit
Upper Limit
1 (High Resolution)
Max
0.070000
0.069970
0.070030
Min
–0.070000
–0.070030
–0.069970
2
Max
0.070000
0.069970
0.070030
Min
–0.070000
–0.070030
–0.069970
3
Max
0.070000
0.069970
0.070030
Min
–0.070000
–0.070030
–0.069970
4
Max
0.070000
0.069969
0.070031
Min
–0.070000
–0.070031
–0.069969
5
Max
0.070000
0.069960
0.070040
Min
–0.070000
–0.070040
–0.069960
6
Max
0.070000
0.069959
0.070041
Min
–0.070000
–0.070041
–0.069959
7 (High Speed)
Max
0.070000
0.069958
0.070042
Min
–0.070000
–0.070042
–0.069958
