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Do not expose a NanoScan to a laser beam if the 
drum is not spinning! Scanhead damage thresholds 
are reduced below specifications when the drum is not 
spinning, increasing the possibility of damage to the 
scanhead. 

High Power caution

When measuring High Power CW or High Energy 
Pulsed lasers, do not expose a NanoScan to a laser 
beam if the drum is not spinning! The NanoScan drum 
does not spin unless the power is ON and the software 
is launched. The laser beams incident on the aperture 
may cause damage to the slits/pinholes and detector 
when the drum is NOT spinning. The slits/pinhole 
substrates are thin membranes which can be damaged 
if stopped in the beam, and if this occurs, the detector 

may also be damaged. Use of a beam dump 
is recommended until the drum is spinning! 

When running long-term tests with NanoScan, 
Configure the PC Power Management to NEVER go 
off, and to NOT ALLOW Automatic Updates. These 
cause the computer to reboot, closing the NanoScan 
program and stopping the NanoScan drum, potentially 
subjecting it to the same type of damage.

Power Connection Caution

When unplugging the unit, NEVER unplug the unit 
without first turning off the software and closing the 
program. Likewise, when plugging in the unit, make 
certain that the program is not running. Failure to do so 
may result in the EEPROM being wiped, and the unit 
needing to be returned to Ophir-Spiricon for repair and 
recalibration. 

ScanHead daMage

IMPortant WarnIng!

NanoScan Scanhead

Summary of Contents for Ophir nanoScan

Page 1: ...am profiler are due to either scanhead damage or out of tolerance conditions Scanhead damage can be categorized into two main types Laser and Mechanical Laser damage is the most prevalent and results from exposure to lasers with excessive laser power energy density and or high average power The damage can be classified into 2 categories designated Instantaneous and Long Term ...

Page 2: ...culate environments and repetitive motion Mechanical damage includes bent motor shafts distorted slits plugged slits and broken signal cables Out of tolerance conditions are either system related including problems associated with circuit or motor failure or the scanhead is not appropriate for the application such as using a Silicon detector to measure a 1550nm source or a 25µm slit for a 10µm bea...

Page 3: ...e damaged if stopped in the beam and if this occurs the detector may also be damaged Use of a beam dump is recommended until the drum is spinning When running long term tests with NanoScan Configure the PC Power Management to NEVER go off and to NOT ALLOW Automatic Updates These cause the computer to reboot closing the NanoScan program and stopping the NanoScan drum potentially subjecting it to th...

Page 4: ...ing on the application and measurement configuration while contamination by many particles is more likely to create a problem With pinhole apertures a single particle can be disastrous Therefore when the system is not is use it is recommended that the protective plastic cap be used to cover the scanhead entrance aperture to avoid possible contamination If inconsistent performance is observed and c...

Page 5: ... of visual damage occurs The average irradiance is defined as the average power divided by the beam area at the 1 e beam diameter All tests were performed under normal NanoScan operating conditions with the aperture slits moving Damage to the slit apertures can occur at much lower power levels if the laser beam is directed into the slit apertures while the apertures are stationary The tests were p...

Page 6: ...l scanheads Fluence exposure thresholds for pulsed lasers are given in Table 2 for nickel alloy blackened nickel alloy and copper slit apertures Table 1 Recommended maximum average laser irradiance incident on blackened and unblackened Nickel NanoScan slit apertures for short time exposures Aperture Slit µm Visual Damage Threshold W cm2 355nm 532nm 1064nm 10 6µm Unblackened 1 2 2x105 3x105 1x106 N...

Page 7: ...or the time limit because it neglects thermal conduction into the drum For reported times 5minutes it is generally safe to operate with continuous exposure but caution is advised Exposure time limits for nickel alloy and copper slit apertures are given in Table 3 Long Term Drum Heating Exposure Limits The long term exposure limits for drum heating are based on a heating model where all the laser p...

Page 8: ...ue to bending the cable to too tight a radius or from repetitive bending when the scanhead undergoes repetitive motion Cable Laser The cable can be severed by a high power laser when accidentally exposed to high power energy lasers This type of damage is avoided by careful routing of the cable Out of Tolerance Conditions Out of tolerance conditions are of two main types either system related or us...

Page 9: ...red Software Solutions BeamGage Standard BeamGage Professional Dual or Single Monitor Set Up M Measuring System Medical Military Industrial Processes Scientific Research Applications Scanning Slit Camera products for almost any wavelength from 13nm 3 000µm ...

Page 10: ... Viton is a registered trademark of E I Dupont Wilmington DE www ophiropt com 2020 MKS Instruments Inc Specifications are subject to change without notice Ophir Spiricon LLC Calibration Team 3050 North 300 West North Logan UT 84341 Phone 435 753 3729 E mail service ophir usa mksinst com For latest version please visit our website www ophiropt com photonics Copyright 2020 Ophir Spiricon LLC N Logan...

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