Mitsubishi MELSEC Q Series, Programming Manual

Page: 395 / 816

7.4 Bit Processing Instructions
7.4.2 Bit test
7-55
7
APPLI
C
A
T
IO
N
INSTRUCTIONS
TEST
, DTES
T
TEST, DTEST
[ST]
TESTP(SM400,Var_D0,10,Var_M0);
[Operation]
(2) In the following program, Var_M0 is turned ON or OFF, depending on the status of the 19th bit
of the 2-word data (Var_W0).
[Structured ladder]
[ST]
DTESTP(SM400,Var_W0,19,Var_M0);
[Operation]
Remark
Programs using the bit test instruction can be rewritten as programs using bit
specification for word devices.
If the program in example (1) were changed to use bit specification for word
devices, it would appear as follows.
1 0 1 1 0 0 1 1 0 1 1 0 1 0 1 0
Var_D 0
b0 b15 b10
Turns Var_ M0 O FF since b10 is 0 .
0 0 1 0 0 1 1 1 1 0 1 0 0 0 0 1
Var_D 0
b0 b15 b10
Turns Var_ M0 O N since b10 is 1 .
1 0 1 1 0 0 1 0 1 0 1 1 0 0 0 0
b31 b19
Turns Var_ M0 O FF since b19 is 0 .
1 0 1 1 0 1 1 1 0 1 1 1 0 1 1 0
b0 b15 b16
0 1 1 0 1 1 0 1 1 1 0 1 1 0 0 1
b31 b19
Turns Var_ M0 O N since b19 is 1 .
1 0 1 0 1 1 0 0 0 0 1 0 1 1 0 1
b0 b15 b16
Var_ W0
Var_ W0
D 0 . A
S pecification of b10 of D 0
M0 turns O N/ O FF d epen d ing on the O N/ O FF
status of b10 of D 0 ( D 0 . A) .
O UT
EN EN O
d M0