Mitsubishi MELSEC Q Series, Programming Manual

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7-54
7.4 Bit Processing Instructions
7.4.2 Bit test
TEST, DTEST
(3) The position specified for specifies the position of each bit in a 1-word data block (0 to
15). When 16 or higher value is specified for , the target is the bit data at the position
indicated by the remainder of n divided by 16. For example, when n 18, the remainder of
18/16 1 is 2, thus the target is the data of b2.
DTEST(P)
(1) Fetches bit data from the location specified for within the 2-word device specified for ,
and writes it to the bit device specified for .
(2) The bit device specified for is turned OFF when the corresponding bit is 0 and ON when
it is 1.
(3) The position specified for specifies the position of each bit in a 2-word data block (0 to
31). When 32 or higher value is specified for , the target is the bit data at the position
indicated by the remainder of n divided by 32. For example, when n 34, the remainder of
34 / 32 1 is 2, thus the target is the data of b2.
O peration Error
No operation error occurs in the execution of the TEST(P) and DTEST(P) instructions.
Program Example
(1) In the following program, Var_M0 is turned ON or OFF depending on the status of the 10th
bit of the 1-word data block (Var_D0).
[Structured ladder]
s 2
s 2
bi t
b15 b0
b5
s 1
d
s 2
s 2
(W hen =5)
s 2 s 1
d
d
s 2
s 2
s 1
d
b15 b0 b31 b16 b21
bi t
s 2
s 2
(W hen =21)