Mecmesin MultiTest 0.5-dV, Operating Manual

Page: 39 / 52

MultiTest -dV Operating Manual
Mecmesin
 39
MultiTest -dV Operation Sequence and Move to Start
MultiTest
-dV
operations, such as the displacement cycle and half cycle consist of two
datum points, an upper displacement and a lower displacement.
For operations with the primary direction being down, the following is true:

The ‘Upper Displacement’ is the start position for the test and the ‘Lower
Displacement’ is the finishing position.
For operations with the primary direction, being up the following is true:

The ‘Lower Displacement’ is the start position for the test and the ‘Upper
Displacement’ is the finishing position.
Within the ‘Edit Test’ display on your test stands front panel there is an option called
‘Move to Start’, setting this feature to ‘Yes’ means that the stand always moves to the
start position.
In some instances, this means the first direction of movement is opposite to the primary
test movement.
For example, if the start displacement is +10 mm and the crosshead is at 0 mm, with
move to start enabled a downward test will first move up to +10 mm before moving
down to the end position. With this feature set to ‘No’, the stand moves straight to the
end position.
Settings: PIN Code
Within the PIN code menu, it is possible to set a four-digit number that can be used to
lock the menu feature of your OmniTest Twin Column. Please note once this has been
set you cannot access the menu without the PIN, so it is crucial that you keep a record
of this safe. If the PIN code has been set and then lost or is unknown, please contact your
local agent or Mecmesin Technical Support.
Settings: Languages
Select your desired language. Upon confirmation, you are returned to the settings menu
in the language chosen.
Settings: Information
This screen is used to display vital information relating to your MultiTest
-dV
and
connected devices. Here you can see software, hardware and firmware properties. If the
stand is operating in
dV
(u) mode you can also see the calibration date for ELS and the
number of overloads that have occurred for the current ELS.