Starting up the CSL 710 with IO-Link interface
Leuze electronic
CSL 710
59
General configurations (group 4)
Blanking settings (group 5)
The type of scanning (parallel/diagonal/crossed beam), the minimum object diameter for evalu
-
ation (smoothing), and filter depth and button lock on the receiver control panel are configured
under group 4 “General configurations”.
Parameter
Index
Sub-
index
Data type
Access Value range
Default Explanation
General settings
71
0
record 32 bit,
isolated
access to
sub-index not
possible
RW
Beam mode
71
1
(bit
offset
= 24)
unsigned 8
RW
0 … 2
0
0: Parallel-beam scanning
1: Diagonal-beam scanning
2: Crossed-beam scanning
Smoothing
71
3
(bit
offset
= 8)
unsigned 8
RW
1 … 255
1
Smoothing:
Less than i interrupted beams are ignored.
Filter depth
74
2
(bit
offset
= 16)
unsigned 8
RW
1 … 255
1
The filter depth indicates the necessary number of
consistent beam states before the evaluation of the
measurement values. The filter depth corresponds
to the number of passes with interrupted beam so
that the result leads to switching.
Switching level of the
inputs/outputs
77
0
unsigned 8
RW
0 … 1
1
0: Transistor, NPN
1: Transistor, PNP
Button lock and display
78
0
unsigned 8
RW
0 … 1
0
Lock operational controls on the device.
0: Enabled
1: Locked
Up to four beam areas can be deactivated. Deactivated beams can be assigned the logical
values 0, 1 or the value of the adjacent beam. With auto blanking activated, up to four beam
areas are automatically suppressed during teaching.
Activate auto blanking only during commissioning of the device to suppress distracting objects.
Deactivate auto blanking in process mode.
For details on this topic see chapter 10.3.
NOTICE
Perform teach after changing the blanking configuration!
Perform a teach after changing the blanking configuration.
A teach can be performed via the receiver control panel or via the teach command.