Operation
5-10
Figure 5-7
Low resistance testing
Transistor testing
Typical transistor tests that can be performed with the aid of
the Model 7021 include current gain tests, leakage tests, as
well as tests to determine the common-emitter characteris-
tics of the device. The following paragraphs discuss these
tests and give typical equipment configurations for the tests.
Current gain tests
The DC or static common-emitter current gain of a transis-
tor can be determined by biasing the transistor for a specific
value of base current, I
B
, and then measuring the collector
current, I
C
. The DC common-emitter current gain,
β
, of the
transistor is then determined as follows:
Figure 5-8 shows the test configuration and equivalent cir-
cuit for the current gain test. The Model 224 Current Source
is used to source the base current, I
B
. The Model 230 Volt-
age Source supplies the collector-emitter voltage, V
CE
, and
the collector current, I
C
, is measured by the Model 2000
DMM. Switching among the transistors being tested is per-
formed by the Model 7021.
Model 182
1
Dual 1x12 MUX
DUTs
(12)
12
1
12
1
12
HI
LO
HI
LO
220 Current Source
182 Input
220 Output
7021
R
220 Current
Source
7021
DUT
V
182
Nanovoltmeter
β
I
C
I
B
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