Model 4210 MMPC-S Quick Start Guide
10
PA-1000 Rev. B / January 2010
C-V testing: 4-pin C-V setup
NOTE
The setup for 4-pin C-V testing requires four prober cable kits.
A typical test for a field effect transistor (FET) is to connect the drain, bulk, and source together and perform the
measurement across the gate. With a Model 4200-CVU connected to the prober bulkhead, use the setup shown in
Figure 13 to perform 4-pin C-V testing.
Figure 13: Test setup for 4-pin C-V testing
Four-pin pulse I-V test setup using the Keithley Model 4200-PIV-A
NOTE
The setup for 4-pin pulse I-V testing requires four prober cable kits.
The Model 4200-PIV-A is a factory-installed package that includes a scope card, pulse generator card, software
and other components to perform 4-pin pulse I-V measurements.
The test setup for using the Model 4200-PIV-A is shown in Figures 14, 15, and 16. Figure 14 shows the
connections from the prober bulkhead to the gate and source of the 4-terminal device. Figure 15 shows the
connections from the bulkhead to the drain and bulk. Figure 16 shows the jumper connections. The four jumpers
connect the commons of the cable assemblies together. Figure 5 shows how the Model 4200 connects to the
outside of the bulkhead.
NOTE
Details on using the Model 4200-PIV-A package are provided in the Model 4200-SCS
User’s Manual (see
How to use the Model 4200-SCS to perform a pulse I-V test on
my device
in Section 3). Figure 3-25 shows the block diagram of the test setup.