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HAPSITE Smart Operating Manual
Chapter 6
Methods
6.1 Introduction to Methods
The versatility of the HAPSITE lies in the variety of methods available. The
HAPSITE can be run in GC/MS mode, MS only mode ("Survey"), and uses various
sampling accessories to extend its capabilities. The accessories include
concentrator tubes, the Headspace Sampling System and the SituProbe. The
following chapter describes the various sampling methods.
6.1.1 Sensitivity
The sensitivity of the HAPSITE is based upon the current configuration and
sampling mode chosen. The Survey Mode is the least sensitive, requiring levels of
greater than 10 ppm (parts per million) for detectability. The sample loop with the
probe and GC/MS methods is able to detect levels in the low ppm to high ppb (parts
per billion) ranges. With a concentrator tube installed, using the probe and GC/MS
methods, the HAPSITE can detect low ppb to high ppt (parts per trillion) levels. The
sample loop with the Headspace Sampling System using GC/MS methods can
detect down to 5 to 10 ppb and even lower with the concentrator installed.
6.2 Survey Method
Survey is used to quickly screen a location for volatile compounds. The sample is
drawn in through the probe and sent directly to the Mass Spectrometer, bypassing
the GC, and providing quick response. The survey mode of sample collection is
also referred to as MIMS (Membrane Interface Mass Spectrometry). The quick
response of a survey method is due to the direct flow of the sample into the mass
spectrometer, without separation of the components by the Gas Chromatograph.
Survey Methods can provide tentative identification of compounds by either
extracting target mass spectra from the MS response or as a result of searching
the total MS response against the AMDIS or NIST library. Survey Methods, when
run from the HAPSITE, also provide an indication of the concentrations of VOCs
based on the response of the TIC (Total Ion Count). The LCD of the HAPSITE
provides a real time plot of response vs. sampling time. Survey Methods can be
Selected Ion Monitoring (SIM) or Full Scan methods. The sensitivity of a survey
method in full scan will be approximately 10 ppm or greater. A Survey SIM method
gives an improved level of sensitivity compared to a Full Scan method. These
sensitivity ranges should be viewed as general guidelines, as the sensitivity of
individual compounds can vary.
Summary of Contents for HAPSITE Smart
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