18 GMC-I
Messtechnik
GmbH
Example:
For a 1 kHz superposed AC voltage, a series-connected capaci-
tor of C
v
= 0.0056 μF = 5.6 nF results for the 50 V
measuring
range.
Attention!
!
The capacitor is loaded up to the value of the DC volt-
age component. The load can assume a magnitude that
can be
lethal
and retain this load for quite some time.
The capacitor must therefore be discharged after mea-
surement!
4.8
Testing Diodes and Transistors
The resistance range
Ω
x 1000 is suitable for approximate func-
tional testing of diodes and transistors. By using a resistance
measurement (see chapter 4.5) it is simple to determine a
short-circuit or interruption of current in a diode or a diode path
between base, collector and emitter in a transistor. This test also
enables the polarity of a diode and the base connection of a
transistor to be determined.
Note!
The positive pole is at socket „
⊥
“, the negative pole is at
socket „
Ω
“.
The DUT is not destroyed during this measurement as the volt-
age does not exceed 1.75 V, and the test current does not
exceed 100 μA.
