Genie Nano-CL C2450, User Manual

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Operational Reference Genie Nano-CL Series™
Width and Height Features for Partial Scan Control
Width and Height controls along with their respective offsets, allow the Nano-CL to grab a region of
interest (ROI) within the full image frame. Besides eliminating post acquisition image cropping
done by software in the host computer, a windowed ROI grab reduces the bandwidth required since
less pixels are transmitted.
Vertical Cropping (Partial Scan)
The Height and Vertical Offset features, used for vertical cropping, reduce the number of video
lines grabbed for a frame. By not scanning the full height of the sensor, the maximum possible
acquisition frame rate is proportionately increased, up to the Genie Nano model maximum.
The following figure is an example of a partial scan acquisition using both Height and Vertical Offset
controls. The Vertical Offset feature defines at what line number from the sensor origin to acquire
the image. The Height feature defines the number of lines to acquire (to a maximum of the
remaining frame height). Note that only the partial scan image (ROI) is transmitted to the host
computer.
Partial Scan Illustration
Width Max WidthMax The maximum image width is the dimension
calculated after horizontal binning, decimation
or any other function changing the horizontal
dimension of the image.
1.00
Invisible
Height Max HeightMax The maximum image height is the dimension
calculated after vertical binning, decimation or
any other function changing the vertical
dimension of the image.
1.00
Invisible